Analytical Methods 8 min read Updated May 2026

X-Ray Fluorescence Analysis (XRF): Method, Applications and the Role of [FP]-LIMS

X-ray fluorescence analysis (XRF) is one of the most important methods in materials analytics – fast, non-destructive and ideal for the metalworking industry and recycling. Here you will learn how the method works, where its limits lie and how [FP]-LIMS integrates XRF measurement data into a seamless, traceable laboratory process.

What is X-ray fluorescence analysis (XRF)?

X-ray fluorescence analysis – often abbreviated XRF – is a common and proven method in the field of materials analytics. It is one of the most widely used techniques for the quantitative and qualitative determination of the elemental composition of a sample.

Its greatest advantage lies in non-destructive analysis: samples are not damaged during measurement, and no elaborate chemical digestion is required to obtain a reliable result. The detection limit is around one microgram per gram (ppm).

How the method works

As a rule, solid samples are examined. Liquids can also be analyzed if they are held in a plastic container with a thin foil base. Most often, solid sample bodies are used, prepared into a round disc with a diameter of 2 to 5 cm. A flat surface is important so that the X-rays are cleanly reflected. The basic principle in three steps:

1
Excitation The sample is irradiated with primary X-rays, which knock electrons out of the inner shells of the atoms.
2
Fluorescence As the resulting gaps are filled, the atoms emit characteristic X-ray radiation – a “fingerprint” of each element.
3
Detection & evaluation The detector measures the energy and intensity of this radiation. From this, the instrument software calculates which elements are present and in what concentration.

Fields of application for XRF analysis

XRF is used particularly widely throughout the metalworking industry, as well as for examining ceramics, building materials and glass, and for analyzing lubricants and mineral oil products. Other typical fields of application:

Metal industry & metallurgy: determination of alloy composition, incoming and outgoing goods inspection.
Recycling & secondary metallurgy: rapid sorting and content determination of scrap metal and alloys.
Gold buying & precious metals: determination of fineness – especially important when gold prices fluctuate.
Art & restoration: non-destructive identification of pigments and element distributions in paintings.
Building materials, ceramics & glass: quality assurance of raw material and product composition.

For gold, for example, the exact fineness of a sample can be determined at the surface – a quick assurance of the actual precious metal content. For works of art, what counts above all is a fast, reliable and gentle result: when a painting is examined by XRF, individual pigments can be identified and the distribution of chemical elements in the image made visible.

Limits of the method

XRF has a physical limit with light elements: it cannot be applied to elements lighter than boron. Reasonably usable readings are only possible from fluorine onwards, and good values only from sodium. The reason: the X-ray radiation of lighter elements is absorbed too strongly and does not reach the detector.

XRF in the LIMS workflow: from measurement to certificate

An XRF measurement provides valuable raw data – but it only delivers its full value when the data is reliably captured, checked, archived and evaluated. This is exactly where [FP]-LIMS comes in. The software connects XRF spectrometers directly via open interfaces and turns individual measured values into a seamless, traceable process.

Automatic data import

XRF measured values are imported in real time – no manual typing and no transmission errors.

Limit checking

Results are automatically checked against specifications and standards; deviations become visible immediately.

Audit-proof archiving

Every value is stored with a complete audit trail – the basis for audits and standards compliance.

Reports & certificates

Evaluations, statistics and test certificates are created at the push of a button – reproducible at any time.

XRF in metallurgy & recycling: a practical example

In metallurgical operations and metal recycling in particular, the combination of fast XRF measurement and a powerful LIMS is especially valuable. Here, every minute counts: incoming scrap must be sorted, melts controlled and batches released – all documented without gaps.

Typical workflow in a metal lab

Incoming goods: a quick XRF measurement classifies incoming materials and alloys.
Process control: during production, samples are measured and automatically checked against target values.
Batch release: only when all values are within specification does the LIMS release the batch.
Documentation: all measurements flow into a central, traceable archive and into test certificates.

At Mannesmann Line Pipe, spectral analyses are transferred via the LIMS directly into the production system and evaluated statistically – securing quality across all process steps.

Practical example from the steel industry

This example shows what matters: it is not the individual measurement that determines quality, but the seamless chaining of measurement, checking, evaluation and documentation. A LIMS like [FP]-LIMS is the connecting element.

Does XRF also work mobile?

Yes. [FP]-LIMS is also used with portable XRF systems. This means measurements can be taken directly on site – for example at the scrap yard, in incoming goods or on the shop floor – and seamlessly fed into the same digital workflow as stationary instruments.

Compatible instrument manufacturers

[FP]-LIMS is compatible with a large number of well-known manufacturers. Over the years, this compatibility has been continuously expanded. Compatible instruments include those from Hitachi, Bruker, Spectro / Ametek, Thermo Fisher Scientific, Agilent Technologies, Analytik Jena, Horiba Scientific, Malvern Panalytical, Microtrac, PerkinElmer and ZwickRoell.

Specifically in the area of X-ray fluorescence analysis, there is a cooperation with the brands Hitachi, Spectro / Ametek, Bruker, Thermo Fisher and Malvern Panalytical.

Frequently asked questions about XRF analysis with [FP]-LIMS

Why is XRF so widespread in metal labs?

The method is fast and requires little sample preparation. That is exactly what makes it so attractive for routine testing of metallic materials – from melt control to scrap sorting.

How does [FP]-LIMS support XRF measurements day to day?

Measurement data is imported automatically and archived centrally. Evaluations, reports and certificates can be generated directly – with no manual transfer and no media breaks.

Does XRF also work mobile with a LIMS?

Yes. [FP]-LIMS is also used with portable XRF systems, so on-site measurements feed into the same digital workflow as those of stationary instruments.

Are there practical references from industry?

Yes. At Mannesmann Line Pipe, spectral analyses are transferred via the LIMS into the production system and evaluated statistically. This supports quality across all process steps.

Which elements can XRF not detect?

Elements lighter than boron cannot be analyzed. Usable values are only possible from fluorine onwards, and good values only from sodium, because the radiation of light elements is absorbed too strongly. Here, combining XRF with complementary methods such as OES is advisable.